Flir Infrared Thailand

FLIR SC2500-NIR Thailand Infrared Camera Specifications

High Performance Versatile InGaAs Camera


The SC2500-NIR complements FLIR's range of products for R&D and automation applications. It embeds a French InGaAs detector with a spectral sensitivity from 0.9 to 1.7μm.


Its removable lens interface makes it easy to integrate with custom devices or spectrometers, while a Gigabit Ethernet digital interface ensures a seamless connection to standard PC and laptops. It features a Trigger input allowing synchronization with the most fleeting event, as well as a Lock-In input used to enhance signal-to-noise ratio imaging, based on an image correlation process.


The camera embeds all necessary images processing in order to deliver ready to use, sharp images for applications such as silicon wafer or solar cells inspection, laser profiling, paint analysis, water or ice detection, imaging spectroscopy or high temperature thermography.


Feature List For SC2500-NIR

Sensor type InGaAs
Waveband 0.9 - 1.7 μm (0.4-1.7μm optional)
Pixel resolution 320 x 256
Pitch 30 μm
Sensor cooling TEC (Regulated / OFF)
Sensor gain Selectable (x1 or x20)
Windowing (down to) 128x8 (user defined)
Max frame rate 340 Hz Full Frame
15 kHz @ 128x8
Integration time Well capacity
Well capacity Well capacity

Optical Specifications

Optical Specifications Available lenses (mm)
Available lenses (mm) 25 / 50 / 75 / 100
Optical Specifications Removable, for 1" filter, up to 2mm
thickness

Measurement

Embedded image processing Non Uniformity
Bad Pixels Replacement
Noise <150 e- RMS (typical)
Quantum efficiency >70% @ 1.5μm

Timing & Signals

Analogue video PAL or NTSC, composite
Digital video 14bits Gigabit Ethernet
Trigger LVTTL
Lock-in input 0 - 10 Vpp data synchronous to image

Physical Specifications

Size (w/o lens) (LxWxH) 82x50x172 mm
Weight (w/o lens) 0.9 Kgs
IP level IP54
Input voltage 12 VDC
Mounting interface Standard Photo Mount


Flir Infrared Thailand

Fully integrated near infrared camera for scientific studies, R&D, and critical processes